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Science 3 November 1989:
Vol. 246. no. 4930, pp. 649 - 651
DOI: 10.1126/science.246.4930.649
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Articles

X-ray Diffraction to 302 Gigapascals: High-Pressure Crystal Structure of Cesium Iodide

H. K. MAO 1, R. J. HEMLEY 1, L. C. CHEN 1, J. F. SHU 1, L. W. FINGER 1, and Y. WU 2

1 Geophysical Laboratory, Carnegie Institution of Washington, 2801 Upton Street, NW, Washington, DC 20008.
2 Center for X-ray Optics, Lawrence Berkeley Laboratory, Berkeley, CA 94720.

X-ray diffraction measurements have been carried out on cesium iodide (CsI) to 302 gigapascals with a platinum pressure standard. The results indicate that above 200 gigapascals CsI at 300 K has a hexagonal close-packed crystal structure with the ideal c/a ratio of 1.63 ± 0.01. The crystal structure and pressure-volume relations converge at high pressure with those of solid xenon, which is isoelectronic with CsI. The results indicate a significant loss of ionic bonding in the hexagonal close-packed metallic phase of CsI at ultrahigh pressure.

Submitted on July 10, 1989
Accepted on September 22, 1989


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Metallic CsI at Pressures of up to 220 Gigapascals.
M. I. Eremets, K. Shimizu, T. C. Kobayashi, and K. Amaya (1998)
Science 281, 1333-1335
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Science. ISSN 0036-8075 (print), 1095-9203 (online)