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17 October 1997
Vol 278, Issue 5337, Pages 353-540

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A

Full Text » Aceves, Richard L. ( in Technical Comments )
Abstract » Full Text » Agner, M. A. ( in Reports )
Abstract » Full Text » Amon, Angelika ( in Reports )
Abstract » Full Text » Anderson, S. A. ( in Reports )
Abstract » Full Text » Annan, R. S. ( in Reports )
Abstract » Full Text » Arvai, Andrew S. ( in Research Articles )
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B

Summary » Full Text » Bagla, Pallava ( in News & Comment )
Abstract » Full Text » Balagurusamy, V. S. K. ( in Reports )
Summary » Full Text » Balter, Michael ( in News & Comment )
Summary » Full Text » Barinaga, Marcia ( in Research News )
Abstract » Full Text » Barker, Christopher J. ( in Reports )
Letters » Bemis, William E. ( in Letters )
Abstract » Full Text » Berggren, Per-Olof ( in Reports )
Abstract » Full Text » Bertorello, Alejandro ( in Reports )
Letters » Beuchat;, Carol A. ( in Letters )
Abstract » Full Text » Bever, Thomas G. ( in Reports )
Abstract » Full Text » Bhatt, Ami ( in Reports )
Abstract » Full Text » Bland, Helen A. ( in Reports )
Abstract » Full Text » Bonni, Azad ( in Reports )
Letters » Brown, James H. ( in Letters )
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C

Abstract » Full Text » Carlqvist, Håkan ( in Reports )
Abstract » Full Text » Carr, S. A. ( in Reports )
Abstract » Full Text » Carter, James F. ( in Reports )
Summary » Full Text » Charlesworth, Brian ( in Book Reviews )
Abstract » Full Text » Chen, Wei R. ( in Reports )
Abstract » Full Text » Cho, W.-D. ( in Reports )
Letters » Churcher;, Charles S. ( in Letters )
Abstract » Full Text » Crane, Brian R. ( in Research Articles )
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D

Abstract » Full Text » Davies, M. E. ( in Reports )
Abstract » Full Text » Deshaies, R. J. ( in Reports )
Summary » Full Text » Desiraju, Gautam R. ( in Perspectives )
Summary » Full Text » Duke, Sean ( in Research News )
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E

Abstract » Full Text » Eisenstat, D. D. ( in Reports )
Abstract » Full Text » Eizinger, Andreas ( in Reports )
Abstract » Full Text » Elliot, J. L. ( in Reports )
Letters » Enquist, Brian J. ( in Letters )
Abstract » Full Text » Evershed, Richard P. ( in Reports )
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F

Full Text » Fesik, Stephen W. ( in Tech.Sight )
Abstract » Full Text » Finch, Caleb E. ( in Articles )
Abstract » Full Text » Frank, David A. ( in Reports )
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G

Abstract » Full Text » Gachhui, Ratan ( in Research Articles )
Full Text » Geller, Robert J. ( in Technical Comments )
Abstract » Full Text » Getzoff, Elizabeth D. ( in Research Articles )
Abstract » Full Text » Ghosh, Dipak K. ( in Research Articles )
Summary » Full Text » Glanz, James ( in Research News )
Summary » Full Text » Glanz, James ( in Research News )
Abstract » Full Text » Glanzman, David L. ( in Reports )
Abstract » Full Text » Greenberg, Michael E. ( in Reports )
Summary » Full Text » Gulisano, Massimo ( in Perspectives )
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H

Full Text » Hajduk, Philip J. ( in Tech.Sight )
Abstract » Full Text » Harris, Jeff ( in Reports )
Abstract » Full Text » Hof, Patrick R. ( in Articles )
Abstract » Full Text » Honkanen, Richard E. ( in Reports )
Abstract » Full Text » Horton, Mark C. ( in Reports )
Summary » Full Text » Hubbard, William B. ( in Perspectives )
Abstract » Full Text » Huddleston, M. J. ( in Reports )
Abstract » Full Text » Hudson, S. D. ( in Reports )
Summary » Full Text » Hui, Li ( in News & Comment )
Abstract » Full Text » Hutchison, Mark ( in Reports )
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J

Full Text » Jackson, David D. ( in Technical Comments )
Abstract » Full Text » Johansson, G. ( in Reports )
Summary » Full Text » Johnston, Dan ( in Perspectives )
Summary » Full Text » Jue, Wang ( in News & Comment )
Abstract » Full Text » Jung, H.-T. ( in Reports )
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K

Full Text » Kagan, Yan Y. ( in Technical Comments )
Abstract » Full Text » Kaplan, Peter D. ( in Reports )
Summary » Full Text » Kerr, Richard A. ( in News & Comment )
Abstract » Full Text » Kitagawa, Teizo ( in Reports )
Letters » Kuikka;, Jyrki ( in Letters )
Abstract » Full Text » Kutzbach, J. E. ( in Reports )
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L

Abstract » Full Text » Lamberts, Steven W. J. ( in Articles )
Abstract » Full Text » LaMendola, Nicholas P. ( in Reports )
Abstract » Full Text » Larsson, Olof ( in Reports )
Abstract » Full Text » Libchaber, Albert ( in Reports )
Abstract » Full Text » Liu, Shumao ( in Reports )
Abstract » Full Text » Liu, Z. ( in Reports )
Summary » Full Text » Lumsden, Andrew ( in Perspectives )
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M

Abstract » Full Text » Mayr, Georg W. ( in Reports )
Abstract » Full Text » McCammon, Catherine ( in Reports )
Full Text » Meadows, Robert P. ( in Tech.Sight )
Abstract » Full Text » Michell, Robert H. ( in Reports )
Abstract » Full Text » Midtgaard, Jens ( in Reports )
Abstract » Full Text » Mizutani, Yasuhisa ( in Reports )
Summary » Full Text » Morell, Virginia ( in Research News )
Summary » Full Text » Morell, Virginia ( in Research News )
Abstract » Full Text » Morrison, John H. ( in Articles )
Full Text » Mulargia;, Francesco ( in Technical Comments )
Abstract » Full Text » Murphy, Geoffrey G. ( in Reports )
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N

Abstract » Full Text » Nadal-Vicens, Mireya ( in Reports )
Letters » Nichols, Rodney W. ( in Letters )
Abstract » Full Text » Nilsson, Thomas ( in Reports )
Summary » Full Text » Normile, Dennis ( in Research News )
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O

Abstract » Full Text » Olkin, C. B. ( in Reports )
Abstract » Full Text » Ouyang, Qi ( in Reports )
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P

Full Text » Park;, Stephen K. ( in Technical Comments )
Abstract » Full Text » Percec, V. ( in Reports )
Full Text » Peters, Richard ( in Tech.Sight )
Full Text » Peters, Richard ( in Tech.Sight )
Full Text » Peters, Richard ( in Tech.Sight )
Full Text » Peters, Richard ( in Tech.Sight )
Abstract » Full Text » Prinz, Susanne ( in Reports )
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R

Abstract » Full Text » Reynard, G. ( in Reports )
Summary » Full Text » Roush, Wade ( in News & Comment )
Summary » Rowe, John W. ( in Editorial )
Abstract » Full Text » Rowley-Conwy, Peter A. ( in Reports )
Abstract » Full Text » Rozovsky, Irina ( in Reports )
Abstract » Full Text » Rubenstein, J. L. R. ( in Reports )
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S

Summary » Full Text » Service, Robert F. ( in News & Comment )
Summary » Full Text » Service, Robert F. ( in Research News )
Abstract » Full Text » Shepherd, Gordon M. ( in Reports )
Abstract » Full Text » Shi, L. ( in Reports )
Full Text » Sikorski, Robert ( in Tech.Sight )
Full Text » Sikorski, Robert ( in Tech.Sight )
Full Text » Sikorski, Robert ( in Tech.Sight )
Full Text » Sikorski, Robert ( in Tech.Sight )
Letters » Simons;, Andrew M. ( in Letters )
Abstract » Full Text » Sjöholm, Åke ( in Reports )
Abstract » Full Text » Sommer, Ralf J. ( in Reports )
Abstract » Full Text » Stahl, Neil ( in Reports )